Senior Device Engineer, STC NAND, Singapore


 As a Senior NAND Memory Cell engineer in the Singapore R&D department at our Client organization., you will be responsible for developing innovative NAND cell technologies to achieve the required performance within project timelines.

Your responsibilities will include, but are not limited to:

  • Develop an understanding of process and device requirements for new NAND cell and help refine requirements, as necessary
  • Developing, communicating, and coordinating the execution of a cell improvement strategy with partners in R&D, Prod      Engineering and Manufacturing
  • Designing and executing quality experiments to improve cell performance, and explore process windows.
  • Driving cross-functional teams to address cell deficiencies and technology gaps.
  • Updating R&D team and management as to the status of the projects.
  • Supporting the transfer, documentation and training of the cell fundamentals into manufacturing.


 Successful candidates for this position will have:

  • Indepth knowledge of and direct experience with, nonvolatile memories (NAND or NOR cells).
  • A fundamental understanding of semiconductor devices and processes with a clear understanding of CMOS device scaling issues
  • Fundamental understanding of typical CMOS device degradation and reliability mechanisms
  • A good understanding of statistics.
  • The ability to coordinate cross-functional teams to achieve a goal.
  • Solid communication and reporting abilities.
  • The ability to be highly skilled at driving for results.
  • Ability to be a self motivated with proven ability to work in a demanding & dynamic environment

  • Ability to travel for extended periods of time to the US for collaborative R&D work


Sub Specialization : All Functions;All
Type of Employment : Permanent
Minimum Experience : 0
Work Location : Singapore

If you would like to apply for the role of Job, please apply online. Kindly note that only shortlisted candidates will be notified.
EA Licence Number: 13C6859
If you encounter difficulties, please click here  for technical assistance.

This site is best viewed with IE 8.0